Light Scattering Techniques for Particle Characterization [AA-11E] – New

Goals

The course participants learn about methods that can be used for characterization of size, shape and charge of the particles.

Principles of light scattering techniques are covered with the emphasis on practical applications of these techniques.

Target Group

People interested in particle characterization techniques with background in science or engineering.

Content

  • Properties of particles: size (size distributions), shape, and charge
  • Basics of light-matter interaction
  • Static light scattering (SLS) (shape, size, distributions)
  • Dynamic light scattering (DLS) (diffusion, size)
  • Electrophoretic light scattering (zeta potential, charge)
  • Other particle characterization techniques: SAXS, SANS, microscopy methods (SEM, TEM, AFM, ...), other electrokinetic methods
  • Practical examples for different techniques
  • How to determine which technique to use
  • Experimental demonstrations of SLS, DLS, and electrophoresis

Approach

Lectures, discussions, and practical demonstrations.

Termin Eigenschaften

Datum 14.09.2018 09:00 - 14.09.2018 17:00
Einzelpreis Individual members CHF 560.00, Non-members CHF 700.00, Students/PhD/retired CHF 300.00
Referent Dr. Gregor Trefalt, Université de Genève
Kurssprache English
Ort
Université de Genève, Sciences II
Quai Ernest-Ansermet 30, 1211 Genève 4, Schweiz
Université de Genève, Sciences II, Genève
753.90CHF

Location Map


Sekretariat Weiterbildung SCG/DAS | ℅ Eawag | Überlandstrasse 133 | CH-8600 Dübendorf
+41 (0)58 765 52 00 | 
infodas@eawag.ch