Light Scattering Techniques for Particle Characterization [AA-11E]
The course participants learn about methods that can be used for characterization of size, shape and charge of the particles.
Principles of light scattering techniques are covered with the emphasis on practical applications of these techniques.
People interested in particle characterization techniques with background in science or engineering.
- Properties of particles: size (size distributions), shape, and charge
- Basics of light-matter interaction
- Static light scattering (SLS) (shape, size, distributions)
- Dynamic light scattering (DLS) (diffusion, size)
- Electrophoretic light scattering (zeta potential, charge)
- Other particle characterization techniques: SAXS, SANS, microscopy methods (SEM, TEM, AFM, ...), other electrokinetic methods
- Practical examples for different techniques
- How to determine which technique to use
- Experimental demonstrations of SLS, DLS, and electrophoresis
Lectures, discussions, and practical demonstrations.
|Event Date||02.09.2019 09:00 - 02.09.2019 17:00|
|Individual Price||Individual members CHF 600.00, Non-members CHF 750.00, Students/PhD Students/retired CHF 320.00|
|Lecturer||Dr. Gregor Trefalt, Université de Genève|
|Location||Université de Genève, Sciences II, Genève|
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